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  1. Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser

  2. A new optical method based on frequency-shift feedback and laser confocal microscopy is presented to noninvasively measure a microstructure inside a sample. Due to the limit of axial resolution caused by poor signal detection ability, conventional la
  3. 所属分类:其它

    • 发布日期:2021-02-24
    • 文件大小:523kb
    • 提供者:weixin_38564085