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  1. Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement

  2. Integrated scatterometer for qualification of superpolished substrates for laser-gyro by surface scatter loss measurement is constructed. Different from the qualification of substrate by surface roughness, the scatterometer measures the forward surfa
  3. 所属分类:其它

    • 发布日期:2021-02-10
    • 文件大小:545kb
    • 提供者:weixin_38735570