M-TEST, an electrostatic pull-in approach for the in-situ mechanical property measure- ments of microelectromechanical systems (MEMS), is used to extract the Young’s modulus and residual stress in polysilicon surface micromachined devices. Its high

The versatile Bouc–Wen model has been used extensively to describe hysteretic phenomena in various fields of engineering. Nevertheless, it is known that it exhibits displacement drift, force relaxation and nonclosure of hysteretic loops when subject

Surface preferential stiffening and melting of Ag nanostructures，刘心娟，杨立文，It has long been puzzling that the surface shell of a nanostructured material is often harder but it melts easier compared with its core interior. Here we clarify that the short

Size-induced elastic stiffening of ZnO nanostructures: skin-depth energy pinning，刘新娟，李建伟，It has long been puzzling regarding the trends and physical origins of the size-effect on the elasticity of ZnO nanostructures. An extension of the atomic “coor

Pressure-stiffened Raman Phonons in Group III Nitrides，G. Ouyang，孙长庆，It has long been puzzling regarding the atomistic origin of the pressure-induced Raman phonon stiffening that generally follows a polynomial expression with coefficients needing ph