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[系统安全] TI产品 Calculating Useful Lifetimes of Embedded Processors
说明: 适用于TI的产品 This application report provides a methodology for calculating the useful lifetime of TI embedded processors (EP) under power when used in electronic systems. It is aimed at general engineers who wish to determine if the reliability of the<csdn_er6211> 上传 | 大小:523kb