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详细说明：下一代测量，测试设备，开发环境，理念的综合阐述，NI官方培训教程Contents
Section 1
EXecutive Summary
Chapter 1
Designing Next Generation Test Systems
Increasing Design Complexity. ....1-1
Shorter Product Development Cycle
Increasing test Cost and decreasing test budget……….…..….…...….-2
Designing Next Generation Test Systems
Test System Management Software
1-4
Conclusion: Designing Next Generation" Test Systems…………….……1-.8
Section 2
Guidelines for Designing Next Generation Test Systems
Chapter 2
Developing a Modular Software Architecture for Reducing development
Cycles and cost
Industry Trends and Challenges ...........2-1
Defining a modular test software Framework.........................2-1
The National Instruments Modular Test Software framework ...........................2-3
pplication development Environments(ade)
Measurement and Control services
Conclusion: Developing a Modular Software Architecture for
Reducing development Cycles and Cost......
Chapter 3
Choosing the right Software Application Development Environment
Factors to Consider When Selecting an ADE
鲁D。音·普看鲁番鲁D鲁音
Lab view Graphical Programming上 nvironment……………
Lab Windows/CVi, an ANSI C Development Environment..........3-7
Microsoft Visual Studio Net(C++, Visual Basic. Net, C#, and ASP. NEt)..3-8
Chapter 4
Hybrid Systems-Integrating Your Multivendor, Multiplatform Test Equipment
The Challenge for Test Systems developers
∴4-1
Making the ris
ht Software Decisions………………………………………×、∽
What Is a hybrid System?
4
Designing your system
4-5
Conclusion: Building Hybrid Systems
4-6
C National Instruments Corporation
Designing Next Generation Test Systems
Contents
Chapter 5
Instrument Bus Performance -Making Sense of competing bus Technologies for
Instrument contro
Understanding bus performance w......................5-1
B
uses
音垂音.音
5-4
Summary: Instrument Bus Performance- Making Sense of
Competing bus technologies for Instrument Control
Chapter 6
Understanding a Modular Instrumentation System for
Automated test
Modular instrumentation-Flexible user-Defined Software and
Scalable hardware Components
番。
Modular hardware for System Scalability
6-3
Modularity lowers Cost and size, Increases Throughput, and Extends lifetime6-5
Software for flexible Custom measurements
6-7
Modular Instrumentation- Meeting the Needs of Automated Test.......6-9
Chapter 7
PXI-The Industry standard Platform for Instrumentation
Hardware Architecture
7-1
Software architecture
7-7
PXI-Industry standard for Modular Instrumentation..............7-8
Why customers Choose pXI?.....................7-9
Expansion of the Pxi Platform-PⅩ I Express……….….…....7-10
Conclusion: PXI- The Industry standard Platform for Instrumentation....7-11
Section 3
Strategies for Improving test system Performance
Chapter 8
Maximizing throughput in an automated Test System
Strategy 1: Choose the Highest-Throughput Bus for Your Application .........8-1
Strategy 2: Choose Software that Takes Full Advantage of the
Latest Processor Technology .......8-3
Strategy 3: Use Hardware Synchronization
8-
Stralegy 4 Design a System Architecture that Supports Parallel
Test and resource Sharing..........................8-6
Conclusion: Maximizing Throughput in an Automated Test Syster
8-10
Designing Next Generation Test Systems
Contents
Chapter 9
Maximizing Accuracy in Automated Test Systems
Understand Instrument Specifications............
Consider Calibration requirements……………………………92
Be aware of the operating environment
Use Proper Fixturing............9-5
Take Advantage of Synchronization......................9-7
Conclusion: Maximizing accuracy in Automated Test Systems
9-8
Chapter 10
Designing and Maintaining a Test System for Longevity
Software Considerations
.10-1
Hardware Considerations
鲁垂
10-3
Maintenance and Support Considerations…………….……………………….10-4
NI Solution for Building and Maintaining Test Systems for Longevity...10-4
Conclusion: Designing and Maintaining a Test System for Longevity.... 10-11
Section 4
Case Studies and Customer Applications
Chapter 11
Software-Defined radio architecture for communications test
Flexible software -Defined communications test .....mw......
PXI一 An ideal platform for software- Defined communications test……
Software-Defined Communications Systems Provide a Future-Proof Platform.11-7
Chapter 12
Microsoft Uses NI labvieW and Pxi modular instruments to develop production
Test System for Xbox 360 Controllers
Designing Powerful Controllers for a New Generation of gaming……………….12-1
PXI Modular Instruments for Design Validation and Production Test....12-2
NI Lab VIEW Interfacing with Microsoft SQL Server, TCP/IP, and
ActiⅤeⅩ Controls.
12-3
Microsoft Sees results Using ni lab vieW and pxI Modular Instruments.. 12-3
Chapter 13
U.S. Air Force Increases Mission-Capable Rates with PXI
U.S. Air Force Increases Mission-Capable rates with pXI
13-1
USing pc-based software and hardware to lower costs . .................................13-2
Reducing test system Size by 50 Percent................13-2
c National Instruments Corporation
Designing Next Generation Test Systems
Chapter 14
Sanmina-SCI Exceeds Throughput Goals with PXI Tester and Multithreaded
Software
Test s
Requirements
14
Compact, High-Speed Test solution ...............14-2
Exceeded Yield expectation
14-3
Referene
Designing Next Generation Test Systems
Executive Summary
Designing Next Generation Test
Systems
Welcome to the Designing Next Generation Test Systems Developers Guide. This
guide is the first in a series of whitepapers designed to help you develop test
systems that lower your cost, increase your test throughput. and can scale with
future requirements
Test managers and engineers use automated test systems in applications ranging
fd
com design validation to end-of-line production test to equipment repair
agnostics with the goal of ensuring the quality and reliability of a product that
the end customer. They can use automated test systems to perform simple
pass"or"fail " tests or a whole range of product characterization measurements
As it grows exponentially more expensive to detect flaws later in the design cycle,
automated test systems have quickly become an even more important part of the
product development process. This first document titled "Designing Next
Generation Test Systems"describes the challenges that continue to pressure
engineering teams to reduce the cost and time of test. It also provides insight into
how test managers and engineers are overcoming these challenges by building
modular, software-defined test systems that significantly increase test system
throughput and flexibility while reducing overall cost
Today's test engineers face a new set of pressures. Test engineers are presented with
the following realities of today s product development environment
Product designs are more complex than their previous generations
Development cycles are shorter to stay competitive and meet customer demand
Budgets are decreasing while product testing is becoming more expensive
Increasing Design Complexity
One of the most visible trends is the increased device complexity. For example, the
consumer electronics, communications and semiconductor industries continue to
drive the convergence of digital imaging/video, high-fidelity audio, wireless
communication, and Internet connectivity into a single product. Even the
automobile has integrated sophisticated car entertainment and information
systems, safety and early warning systems and body and engine control
electronics. Test system designs must be flexible enough to support the wide
variety of tests that differ between product models but also scalable to
accommodate a larger number of test points as new measurement functionality is
required
C National Instruments Corporation
Designing Next Generation Test Systems
Lesson 1 Designing Next Generation Test Systems
Shorter Product Development cycle
The ever-increasing demand for the latest product or technology combined with the
competitive nature of being the first to market puts pressure on design and test
engineering teams to shorten their product development cycles. To be successful
engineering teams need to develop new test strategies to decrease test time and
improve efficiencies from design through production
Increasing Test Cost and Decreasing Test Budget
Increase device functionality often leads to a more expensive and time-consuming
test process. However, the cost to build each function is decreasing, which
challenges test engineering departments to reduce its cost and budget, as shown in
Figure 1-1. As a result, engineers must develop test strategies that reduce cost by
increasing the throughput of their test systems, reducing the maintenance and
upgrade costs, and lowering the required capital investment
Cost of silicon Manufacturing and test
0.1
Si capital/transisto
0.01
0.001
Test capital/ transistor
0.0001
0.0000
0.000001
00000001
19821985198819911994199720002003200620092012
Based on SIA Roadmap Data
Figure 1-1. Data from SIa illustrates that the cost of silicon(or device function)has
decreased over time but the cost to test continues to increase
Designing next generation Test Systems
To meet the challenges they face with increased device complexity, shorter
development cycles, and decreased budgets, test managers and engineers are being
forced to abandon traditional test design strategies based on traditional box
instruments or "big iron " propriety ATE systems. These stand-alone instruments
lack the flexibility needed as the software processing and user interface are defined
by the supplier and can only be updated by the supplier through firmware. This
makes it difficult to perform measurements not defined in the instrument's
firmware and measurements for new standards or to modify the system if
requirements change. These devices also lack necessary integration capabilities
such as data streaming and synchronization because they are designed primarily to
Designing Next Generation Test Systems
1-2
n. com
Lesson 1 Designing Next Generation Test Systems
work as stand-alone instruments and not for integrated system use. Propriety atE
systems, such as highly integrated production chip testers, provide the performance
needed but are typically cost-prohibitive and can leave engineering teams
vulnerable to obsolescence and untimely system redesigns
In response to these trends test managers and engineers are now implementing
modular, software-defined test architectures based on widely adopted industry
standards to provide
Increased test system flexibility deployable to a variety of applications
business segments, and product generations
Higher-performance architectures that significantly increase test system
throughput and enable tight correlation and integration of instruments from
multiple suppliers including precision DC, high-speed analog and digital, and
RF Signal generation and analysis
Lower test svstem investments by reducing initial capital investment and
maintenance cost while increasing equipment use across multiple test
requirements
Increased test system longevity based on widely adopted industry standards
that enable technology upgrades to improve performance and meet future test
requirements
National Instruments, a leader in automated test, is committed to providing the
hardware and software products engineers need to create these next generation test
systens
This in-depth developers guide includes the information you need to design your
next test system architecture. This introduction describes a test system architecture
igure 1-2, that provides engineers with a strategy to meet challenges related to
increased device complexity, shorter development cycles, and decreased budgets
c National Instruments Corporation
Designing Next Generation Test Systems
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