文件名称:
MTBF Telcordia_SR-332 Issue 4 2016.pdf
开发工具:
文件大小: 64mb
下载次数: 0
上传时间: 2019-08-17
详细说明：电子设备可靠性预测标准，Telcordia_SR-332 Issue 4 。Reliability Prediction Procedure for Electronic Equipment
sR-332
Special Report Notice of Disclaimer
Special Report Notice of Disclaimer
This Special Report is published by Telcordia Network Infrastructure Solutions,
NIS", a division of Ericsson Inc., to inform the industry of the Telcordia view of
Reliability Prediction Procedure for Electronic Equipment
Telcordia reserves the right to revise this document for any reason including but not
limited to, conformity with standards promulgated by various agencies; utilization
of advances in the state of the technical arts; or the reflection of changes in th
design of any equipment, techniques, or procedures described or referred to herein.
TELCORDIA AND ANY OTHER PARTICIPANTS IDENTIFIED IN SECTION 1 MAKE
NO REPRESENTATION OR WARRANTY EXPRESS OR IMPLIED WITH RESPECT
TO THE SUFFICIENCY. ACCURACY OR UTILITY OF ANY INFORMATION OR
OPINION CONTAINED HEREIN
TELCORDIA AND ANY OTHER PARTICIPANTS IDENTIFIED IN SECTION 1
EXPRESSLY ADVISE THAT ANY USE OF OR RELIANCE UPON SAID
INFORMATION OR OPINION IS AT THE RISK OF THIE USER AND THAT NEITHER
TELCORDIA NOR ANY OTHER PARTICIPANTS SHALL BE LIABLE FOR ANY
DAMAGE OR INJURY INCURRED BY ANY PERSON ARISING OUT OF THE
SUFFICIENCY. ACCURACY OR UTILITY OF ANY INFORMATION OR OPINION
CONTAINED HEREIN
LOCAL CONDITIONS MAY GIVE RISE TO A NEED FOR ADDITIONAL
PROFESSIONAL INVESTIGATTONS MODIFICATIONS OR SAFEGUARDS TO
MEET SITE, EQUIPMENT, ENVIRONMENTAL SAFETY OR COMPAN Y-SPECIFIC
REQUIREMENTS. IN NO EVENT IS THIS INFORMATION INTENDED TO
REPLACE FEDERAL STATE. LOCAL OR OTHER APPLICABLE CODES. LAWS
OR REGULATIONS. SPECIFIC APPLICATIONS WILL CONTAIN VARIABLES
UNKNOWN TO OR BEYOND THE CONTROL OF TELCORDIA. AS A RESULT
TELCORDIA CANNOT WARRANT THAT THE APPLICATION OF THIS
INFORMATION WILL PRODUCE THE TECHNICAL RESULT OR SAFETY
ORIGINALLY INTENDED
This Special report is not to be construed as a suggestion to anyone to modify or
change any product or service, nor does this Special report represent any
commitment by anyone, including but not limited to Telcordia or any participants in
the development of this Telcordia special report, to purchase, manufacture, or sell
any product or service with the described characteristics
Readers are specifically advised that any entity may have needs, specifications, or
requirements different from the generic descriptions herein. Therefore, anyone
wishing to know any entity's needs, specifications, or requirements should
communicate directly with that entity
Nothing contained herein shall be construed as conferring by implication, estoppel
or otherwise any license or right under any patent, whether or not the use of any
information herein necessarily employs an invention of any cxisting or later issued
patent.
Licensed Exclusively to ABB
Enterprise License Restrictions. See restrictions on title page
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
sR332
Special Report Notice of Disclaimer
Issue 4 March 2016
TELCORDIA DOES NOT HEREBY RECOMMEND APPROVE CERTIFY
WARRANT GUARANTEE OR ENDORSE ANY PRODUCTS. PROCESSES OR
SERVICES. AND NOTHING CONTAINED HEREIN IS INTENDED OR SHOULD BE
UNDERSTOOD AS ANY SUCH RECOMMENDATION. APPROVAL
CERTIFICATION. WARRANTY GUARANTY OR ENDORSEMENT TO ANYONE
If further information regarding technical content is required, please contact
Richard Kluge, NEBSTM Director
Telcordia-SR-332
One ericsson Drive
Piscataway, NJ 08854
Phono:+1.732.7359929
E-mail:richard.klugeericsson.com
For general information about this or any other Telcordia documents, please
contact
Customer service
One ericsson drive
Piscataway, NJ 08854
+1844.251.0201( Worldwide)
E-mail:buss.document-infoericsson.com
Web site: Telcordia superStore
Licensed Exclusively to ABB
Enterprise License Restrictions. See restrictions on title page.
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
Reliability Prediction Procedure for Electronic Equipmen
sR-332
Table of contents
Table of contents
1 Introduction
1.1 Purpose and scope
1. 2 Changes
1-2
1.3 Structure of this Report
1. 4 Participants in the Development of Sr-332, Issue 4
1.5 Automated Reliability Prediction Procedure(ARPP)...............1-3
2 Reliability Predictions for Electronic Equipment
2.1 Purposes of Reliability predictions
2-1
2 Definitions
2.2.1 Equipment definitions
22
2.2.2 Definition of a failure
2.2.3 Definition of failure rate
2. 2.3. 1 Life Cycle of Electronic Equipment
2.2.3.2 RPP Failure rate predictions
24
2.2.3.3 Factors Affecting failure rates
.2-4
2. 3 Outline of methods
2.3. 1 Flow of Early Life Failure Rate Calculations
2.3.2 Flow of Steady-State failure rate calculations
2.3.3 Items and factors Excluded from failure rate calculations
2-8
2.3.4 Guidance for Device Types/Technologies Not in Section 8
2.3.5 Statistical considerations
90
2.3.5.1 Upper Confidence levels
2.3.5.2 Alternate and Supplementary Method
,,,2-10
2.3.6 Automated Reliability Prediction Procedure(ARPP)
.,210
3 Steady state Failure Rate Prediction for Devices
3.1 Method I-D: Black Box Technique
,,,,,,,,,,.3-1
8.2 Method II-D: Techniques Integrating Laboratory Data.
3.2.1 When Laboratory Test Devices Ilad No Previous Burn-in
3.2.2 When laboratory test devices Had Previous Burn-in ...........3-3
3.3 Method Ill-D: Techniques Integrating Field Data
34
3.3.1 Total Operating Hours
3-5
3.3.2 Adjustment Factor(V)
3.4 Examples
,,,,,,,,,,,36
3.4.1 Example 1 Method i-d. black box technique
....3-6
3.4.2 Example 2: Method II-D, Integrating Laboratory Test Data
8.4.2.1 Example 2a: No Burn-In of Laboratory Test Devices
3.4.2.2 Example 2b: Previous Burn-In of Laboratory Test Devices .....3-7
3.4.3 Example 3: Method Ill-D, Integrating Field Data
3-8
8.4.3.1 Example 3a: Subject Device is in Test Unit and Operated at
the same Temperature and Electrical Stress
39
3.4.3.2 Example 3b Subject Device is in Test Unit but Operated at
Different Temperature
Licensed Exclusively to ABB
Enterprise License Restrictions. See restrictions on title page
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
SR-332
Table of contents
Issue 4 March 2016
4 Early Life Factor Prediction for Devices
4.1 Early Lile Factor for Device with limited or No Burn-In.....,....... 4-1
4.2 Early Lifc Factor for Devicc with Extensivc Burn-In
41
4.2.1 Equivalent Operating Time for Burn-in
4-1
4.2.2 Early Life factor
4-2
4.3 Examples
,,,42
4.3.1 Example 1: Limited or No Burn-In
4-2
4.3.2 Example 2: Extensive Burn-In
4-3
5 Failure rate prediction for Units
5. 1 Method I: Unit Steady-State Failure Rate Using the Parts Count Method.... 5-1
5.2 Method ll: Integrating Laboratory Test Data on Units
,5-3
5.2.1 When laboratory Test Units Have No Previous Unit/Device Burn-In... 5-3
5.2.2 When Laboratory Test Units Had Previous Burn-in
5-4
5.3 Method Il: Integrating Field Data on Units
,55
5.3. 1 Total Operating Hours
5-6
5.3.2 Adjustment Factor(V)
5-6
5.4 Unit early Life factor
5.5 Sampling Method-Using Default Temperature and stress factors on a
Sample of units
.,.,,,5-7
5.6Eⅹ amples
5.6.1 Example 1: Method I. Parts Count Prediction
5-8
5.6.2 Example 2: Early life factor
5.6.3 Example 3: Method Il, Integrating Laboratory Test Data
510
5.6.3.1 Example 3a: No Previous burn-In of laboratory test units
5-10
5.6.3.2 Example 3b: Previous Burn-In of Laboratory Test Units...... 5-10
5.6.4 Example 4: Method il, Integrating Field Test Data
5.6.4.1 Example 4a: Subject unit and Test Unit are Identical and
Operated under the Same conditions
5.6.4.2 Example 4b: Subject Unit and Test Unit are Identical but
Operated in different environments
-12
5.6.4.3 Example 4c: Test Unit Is Similar but Not Identical to
Subiect unit
12
5.6.5 Example 5: Method l, Parts Count Prediction, Devices Within a
Device Type Have Different Operating Temperatures
512
System Reliability(service Affecting Reliability Data)
6. 1 Serial System reliability
6.1.1 Steadv-State Failure Rate
6.1. 2 Early Life Facto
6
6.2 Non-Serial Systems
7 Upper Confidence Levels for Failure Rates
7.1 Upper Confidence Level calculalion
7-1
7.2 Examples
7.2.1 Example 1: 90% Upper Confidence Level of the Steady-State
7-2
Failure rate
7-2
7.2.2 Example 2: 90% Upper Confidence Level of the Early life
Failure rate
Licensed Exclusively to ABB
Enterprise License Restrictions. See restrictions on title page.
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
Reliability Prediction Procedure for Electronic Equipmen
sR-332
Table of contents
8 Device Parameter values
8.1 Capacitor Parameter values
8.2 Connector parameter values
83
8. 3 Diode parameter values
8. 4 Inductor Parameter Values
8.5 Integrated Circuit Parameter values
,,,,,,86
8.5.1 Analog integrated circuit devices
8.5.2 Digital Integrated Circuit Devices
8-8
8.5.3 Random Access Memory(RAm)
8-10
8.5.4 Read Only Memory (ROMS, PROMS, EPROMS)
8.5.5 Microprocessor
8.5.6 Microcontroller
,8-15
8.5. 7 Hybrid Microcircuits
,,,,,,,,815
8.5.8 Combined Analog- Digital Integrated Circuit (Gate array and
Program array logic)
,,,8-16
8.6 Microwave Element devices
8-17
8.7 Opto-Electronic Device Parameter Values
818
8.7.1 Fiber Optic Communication Devices and modules
8.7.2 Other Opto-Electronic Devices
820
8.8 Relay Parameter values
821
8. 9 Resistor parameter values
8. 9. 1 Fixed resistor
8.9.2 Variable resistor
823
8.9.3 Resistor Networks
824
8. 10 Switch Parameter values
.825
8.11 Thermistor parameter values
,826
8. 12 Transistor Failure rat
8.13 Rotating and miscellaneous device parameter values
829
9 Failure Rate Facto
9.1 Temperature Factor
9-1
9.2 Electrical st
Factor
9-3
9. 2.1 Electrical stress curves
9-3
9. 2.2 Electrical stress percentage
,,,,,,,,,,,,,,94
9.3 Quality factor
9-6
9. 4 Environment Factor
,9-8
Appendix A: Failure Rate Units
Appendix B: References
B. 1 Telcordia documents
B-1
B 2 Non-Telcordia documents
B-1
B 3 Documents on derating
B
B 41 Telcordia Documents Referencing SR-332 ora Predecessor
B
B5 Reference notes
B-6
B 6 Contact Customer Service
.B-6
B 7 Order Documents Online From the Telcordia superStore
B8 Web Sites for generic Requirements Information
B-7
B 9 Licensing Agreements for Telcordia documents
Licensed Exclusively to ABB
Enterprise License Restrictions. See restrictions on title page
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
SR-332
Table of contents
Issue 4 March 2016
Appendix C: Glossary
C1 Acronyms
C-1
C 2 Definition of terms
Licensed Exclusively to ABB
Enterprise License Restrictions. See restrictions on title page.
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
Reliability Prediction Procedure for Electronic Equipmen
sR-332
List of Figures
List of Figures
Figure 2-1 Bathtub Curve
Licensed Exclusively to ABB
X
Enterprise License Restrictions. See restrictions on title page
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
SR-332
List of Tables
Issue 4 March 2016
List of tables
Table 1-1
Participants in the development of SR-332, Issue 4
Table 81
Capacitor failure Rate Parameters
82
Table 8-2 Connector failure rate parameters
83
Table 8-3 Diode failure rate parameters.
84
Table 8-4
Inductor failure rate Parameters
85
Table 8-5
Analog Integrated circuit Failure rates
8-7
Table 8-6 Digital Integrated circuit Failure Rate Parameters
,,,,,8-8
Table 8-7
Digital Integrated Circuit Failure Rates
89
Tablc 8-8 Random Access Memory Failure Rate Paramcters
810
Table 8-9
Static Random Access Memory (sram failure rates
8-11
Table 8-10 Dynamic Random Access Memory(dram)Failure Rates..... 8-12
Table 8-11 Read Only Memory Failure Rate Parameters
..8-13
Table 8-12 Read Only Memory Failure rates
Table 8-13 Microprocessor Failure Rate Parameters
8-14
Table 8-14
Bipolar and NMOS Microprocessor Failure rates
Table 8-15 CMOS Microprocessor failure rates
15
Table 8-16 Microwave element device failure rate parameters
Table 8-17
Fiber optic communication Device/Module Failure Rate.... 8-17
Parameters
.8-18
Table 8-18 Opto-Electronic Device Failure rate Parameters
820
Table 8-19 Relay failure Rate Parameters
.821
Table 8-20 Fixed resistor failure rate parameters
822
Table 8-21 variable resistor failure rate parameters
.82:3
Table 8-2
Resistor network failure rate parameters
824
Table 8-23 Switch failure rate parameters
825
Table 8-24 Thermistor Failure Rate Parameters
,,,,,,,826
Table 8-25 Transistor failure rate parameters
827
Table 8-26
Miscellaneous device failure rate parameters
829
Table 8-27 Rotating and Miscellaneous Device Failure Rate Parameters...8 30
Table-
Temperature Factors TT
9-2
Table 9-2 Electrical Stress Factors Ts
Table 9-3 Guidelines for Determination of Electrical Stress Percentage
9-5
Table 9-4 Device Quality Level Description and Factor No
9-7
Table 9-5
Environmental Conditions and multiplier Factors TE)
9-8
Table a-l Reliability Conversion Factor
A-1
Licensed Exclusively to ABB
Enterprise License Restrictions, See restrictions on title page
Ericsson strictly prohibits the unauthorized distribution, download, or sale of this copyrighted material
(系统自动生成,下载前可以参看下载内容)
下载文件列表
相关说明
- 本站资源为会员上传分享交流与学习,如有侵犯您的权益,请联系我们删除.
- 本站是交换下载平台，提供交流渠道，下载内容来自于网络，除下载问题外，其它问题请自行百度。
- 本站已设置防盗链，请勿用迅雷、QQ旋风等多线程下载软件下载资源，下载后用WinRAR最新版进行解压.
- 如果您发现内容无法下载，请稍后再次尝试；或者到消费记录里找到下载记录反馈给我们.
- 下载后发现下载的内容跟说明不相乎，请到消费记录里找到下载记录反馈给我们，经确认后退回积分.
- 如下载前有疑问，可以通过点击"提供者"的名字，查看对方的联系方式，联系对方咨询.
