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  1. Investigation of low-temperature cathodoluminescence mechanism of Er-doped GaN thick films by ion implantation

  2. Er ions are implanted into the GaN thick films grown by hydride vapor phase epitaxy. The implantation energy is 200 keV and the implantation doses are 1×1013, 1×1014, 1×1015, and 5×1015 atom/cm2, respectively. The effects of the implantation dose and
  3. 所属分类:其它

    • 发布日期:2021-02-23
    • 文件大小:288kb
    • 提供者:weixin_38717574